发明名称 |
Data input buffer for a semiconductor memory device |
摘要 |
The present invention relates to a data input buffer for a semiconductor memory device and, in particular, to a data input buffer which can operate stably in spite of a change in the supply voltage Vcc. A data input buffer for a semiconductor memory device comprises: a supply-voltage measuring circuit for measuring the level of an externally applied supply voltage and for generating a supply-voltage measuring signal, a first conductive path, which connects an internal supply voltage and a level-reading node in order to control the amount of current therein in accordance with the supply-voltage determining signal, and a second conductive path, which connects the level-reading node to an earth potential in order to control the amount of current therein in accordance with the supply-voltage determining signal.
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申请公布号 |
DE4435649(A1) |
申请公布日期 |
1995.04.13 |
申请号 |
DE19944435649 |
申请日期 |
1994.10.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD., SUWON, KR |
发明人 |
KANG, KYUNG-WOO, SUWON, KR |
分类号 |
G11C11/413;G11C5/14;G11C7/10;G11C11/409;H03K19/003;H03K19/0175;H03K19/0185;(IPC1-7):G11C5/14;G11C7/00 |
主分类号 |
G11C11/413 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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