发明名称 Method for producing semiconductor laser device using etch stop layer
摘要 In accordance with the invention, after a crystal growth is carried out successively to produce at least a first conductivity type lower cladding layer, an active layer, a second conductivity type first upper cladding layer of AlGaAs having an AlAs composition ratio of 0.38 to 0.6, an etching stopper layer of AlGaAs having an AlAs composition ratio of more than 0.6, and a second conductivity type second upper cladding layer of AlGaAs having an AlAs composition ratio of 0.38 to 0.6, the second upper cladding layer is selectively etched using an etchant including an organic acid and hydrogen peroxide, thereby forming a ridge. As a result, a ridge-type semiconductor laser device which has a desirable laser structure and an oscillation wavelength below 830 nm can be produced easily with improved controllability and reproducibility.
申请公布号 US5420066(A) 申请公布日期 1995.05.30
申请号 US19940267211 申请日期 1994.07.06
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 SHIMA, AKIHIRO;MIURA, TAKESHI;KADOWAKI, TOMOKO;HAYAFUJI, NORIO
分类号 H01S5/00;H01S5/20;H01S5/22;H01S5/223;H01S5/323;(IPC1-7):H01L21/302 主分类号 H01S5/00
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