发明名称 CIRCUITRY TO PROTECT A TEST INSTRUMENT
摘要 Controlling a test instrument may include: determining a first value corresponding to power output by the test instrument; determining a second value based on the first value, where the second value corresponds to an amount of energy consumed by the test instrument; and placing at least part of the test instrument in a high-impedance state when the second value exceeds a threshold.
申请公布号 SG11201608007S(A) 申请公布日期 2016.10.28
申请号 SG11201608007S 申请日期 2015.04.13
申请人 TERADYNE, INC. 发明人 POUNDS, DOUGLAS W.;CARLINE, CHARLES J.
分类号 G01R31/28;G01R19/165;G01R31/02 主分类号 G01R31/28
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