发明名称 MANUFACTURE OF QUANTUM FINE WIRE STRUCTURE
摘要 PURPOSE:To provide a method of manufacturing the quantum fine wire structure of a compound semiconductor device which is of low damage, high density and excellent controllability. CONSTITUTION:A buffer layer 102, a barrier layer 103, a quantum well layer 104 and a barrier layer 105 are successively formed by crystal growth. Then an oxide film 106 is built up and a resist pattern 107 is formed by lithography. The oxide film 106 is etched and the resist pattern 107 is transferred to form a mask. The barrier layer 105 and the quantum well layer 104 are etched by ion beam etching. The barrier layer 103 is etched by wet etching in a depth direction and, as the wet etching is also developed laterally, the wire widths of the barrier layer 105 and the quantum well layer 104 are narrowed. An Al0.3 Ga0.7 As buried layer 109 is built up by crystal growth over the whole surface by a molecular beam epitaxy method.
申请公布号 JPH07273084(A) 申请公布日期 1995.10.20
申请号 JP19940122438 申请日期 1994.06.03
申请人 HIKARI GIJUTSU KENKYU KAIHATSU KK;MATSUSHITA ELECTRIC IND CO LTD 发明人 WAKABAYASHI SHINICHI;TOGO HITOMARO;TOYODA YUKIO
分类号 H01L29/06;H01L21/302;H01L21/306;(IPC1-7):H01L21/306 主分类号 H01L29/06
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