发明名称 Verfahren und Vorrichtung zur Messung der Fehlerdichte und -verteilung
摘要 <p>A method and apparatus for measuring a defect distribution comprising introducing a narrowed laser beam into an object to be observed, receiving scattering lights generated at the defect portions of the object by a photoelectric conversion element, and measuring automatically the density and density distribution of the defects inside the object on the basis of the output image data of the photoelectric conversion element.</p>
申请公布号 DE3854961(T2) 申请公布日期 1996.05.30
申请号 DE19883854961T 申请日期 1988.11.25
申请人 MITSUI MINING & SMELTING CO., LTD., TOKIO/TOKYO, JP 发明人 MORIYA, KAZUO, AGEO-SHI, SAITAMA-KEN, JP
分类号 G01N21/88;G01N21/00;G01N21/35;G01N21/3563;G01N21/359;G01N21/47;G01N21/95;G06T7/00;H01L21/66;(IPC1-7):G01N21/88;G06T7/60 主分类号 G01N21/88
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