发明名称 X-ray inspection system
摘要 This invention relates to a high resolution X-ray imaging device for congruently combining an optical image from a video system with a fluoroscopic X-ray image from a fluoroscopic imaging system. An X-ray beam is directed towards a predetermined position of an object to be inspected and an X-ray image is received at the fluoroscopic imaging system for generating the fluoroscopic X-ray image. A mirror is positioned between the fluoroscopic imaging system and the X-ray beam. The X-ray beam passes substantially unattenuated through the mirror. Preferably, the mirror is formed of a composition having elements with an atomic number of less than 14. An optical image of the predetermined location of the object is reflected off of the mirror. The optical image and the fluoroscopic X-ray image can be combined into a superimposed image.
申请公布号 US5590170(A) 申请公布日期 1996.12.31
申请号 US19940328465 申请日期 1994.10.25
申请人 GLENBROOK TECHNOLOGIES 发明人 ZWEIG, GILBERT
分类号 G01N23/04;G01R31/302;(IPC1-7):G01N23/04 主分类号 G01N23/04
代理机构 代理人
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