发明名称 HIGH DENSE INTEGRATED CIRCUIT PACKAGE AND METHOD OF FORMING IT
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor die unit whose dimensions are precise. SOLUTION: A semiconductor die unit 150 to be provided contains a first semiconductor substrate which comprises a first face and a second generally opposite face and in which a plurality of semiconductor devices are formed. The semiconductor die unit to be provided contains at least one of a first metal coating layer which is arranged on a first face of the first semiconductor substrate in order to form interconnections 414 between the semiconductor devices. The outside dimensions of the semiconductor die unit are partitioned by lithography. A carrier 208 which supports the semiconductor die unit contains a substrate comprising a recess partitioned by lithography in order to receive the semiconductor die unit.</p>
申请公布号 JPH0917753(A) 申请公布日期 1997.01.17
申请号 JP19960136192 申请日期 1996.05.30
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 EICHI BAANHAADO POTSUGU;YOHAN GURESHIYUNAA;HAWAADO REO KARUTAA;REIMONDO JIEEMUZU ROSUNAA
分类号 H01L21/28;H01L21/301;H01L21/98;H01L25/065;H01L29/06;(IPC1-7):H01L21/301 主分类号 H01L21/28
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