发明名称 |
HIGH DENSE INTEGRATED CIRCUIT PACKAGE AND METHOD OF FORMING IT |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor die unit whose dimensions are precise. SOLUTION: A semiconductor die unit 150 to be provided contains a first semiconductor substrate which comprises a first face and a second generally opposite face and in which a plurality of semiconductor devices are formed. The semiconductor die unit to be provided contains at least one of a first metal coating layer which is arranged on a first face of the first semiconductor substrate in order to form interconnections 414 between the semiconductor devices. The outside dimensions of the semiconductor die unit are partitioned by lithography. A carrier 208 which supports the semiconductor die unit contains a substrate comprising a recess partitioned by lithography in order to receive the semiconductor die unit.</p> |
申请公布号 |
JPH0917753(A) |
申请公布日期 |
1997.01.17 |
申请号 |
JP19960136192 |
申请日期 |
1996.05.30 |
申请人 |
INTERNATL BUSINESS MACH CORP <IBM> |
发明人 |
EICHI BAANHAADO POTSUGU;YOHAN GURESHIYUNAA;HAWAADO REO KARUTAA;REIMONDO JIEEMUZU ROSUNAA |
分类号 |
H01L21/28;H01L21/301;H01L21/98;H01L25/065;H01L29/06;(IPC1-7):H01L21/301 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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