发明名称 |
FORMING METHOD OF FIELD OXIDE FILM |
摘要 |
A forming method of a field oxide is provied to increase an active region by decreasing a bird's beak of field oxide. The method comprises the steps of: sequentially forming a pad oxide(2) and polysilicon layer(3) on a silicon substrate(1); forming a first oxynitride layer(5) by annealing the surface of the polysilicon under NH3 or N2O gas; selective etching the nitride layer(4), the oxynitride layer(5) and the polysilicon layer(3) to form a field oxide region(6); forming a second oxynitride layer(5') on the surface and at side wall of the remained polysilicon by annealing under NH3 or N2O gas; and forming a field oxide(8) by thermal oxidation after removing the second oxynitride layer(5') on the pad oxide(2).
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申请公布号 |
KR970000701(B1) |
申请公布日期 |
1997.01.18 |
申请号 |
KR19930004550 |
申请日期 |
1993.03.23 |
申请人 |
HYUNDAI ELECTRONICS IND.CO.,LT.D |
发明人 |
LEE, HYUN-WOO;JANG, SE-UK |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
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主权项 |
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地址 |
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