发明名称 OXIDATION METHOD OF SEMICONDUCTOR DEVICE
摘要 A method for growing a thermal oxide layer in a formation of a semiconductor device is disclosed. The A method for growing a thermal oxide layer in a formation of a semiconductor device comprises the steps of: a) performing a first dry oxidation using oxygen gas at a predetermined temperature in a oxidation tube; b) performing a wet oxidation using oxygen/hydrogen gas; c) performing a second oxidation using oxygen gas. Thereby, high pressure of processing tube is kept and the processing time is reduced and a processing temperature is lowered. In addition, the gas amount of nitrogen is automatically controlled, resulting in obtaining a high quality of oxidation.
申请公布号 KR970000702(B1) 申请公布日期 1997.01.18
申请号 KR19930010712 申请日期 1993.06.12
申请人 HYUNDAI ELECTRONICS IND.CO.,LTD. 发明人 KIM, CHUN-SOO;BANG, CHOL-WON
分类号 H01L21/31;(IPC1-7):H01L21/31 主分类号 H01L21/31
代理机构 代理人
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