发明名称 SEMICONDUCTOR DEVICE & METHOD FOR FORMING THE SAME
摘要 The present invention is to provide a method for fabricating semiconductor device. The method for fabricating according to the present invention comprises: a) forming a gate electrode(14) on a semiconductor substrate(10) using polysilicon gate electrode(14); b) forming a spacer(16) on side walls of the gate electrode(14); c) forming an insulating layer(20) after forming a diffusion layer(15) using the gate electrode(14) as a mask; d) forming a contact hole(21,23) on the gate electrode(14) and the diffusion layer(15); and e) forming a wiring layer(24,25) on the insulating layer(20), thereby interconnecting the wiring layer(24,25) with the gate electrode(14) and the diffusion layer(15). The present invention further comprises forming a second silicide(22) between contact portions of the wiring layer(24,25) and the first silicide(20). The first silicide(20) is formed on the wiring layer(24,25) and the gate layer(14) and the diffusion layer(15).
申请公布号 KR970005729(B1) 申请公布日期 1997.04.19
申请号 KR19910012170 申请日期 1991.07.16
申请人 SAMSUNG ELECTRONICS CO.,LTD. 发明人 SIM, MYUNG-SUB;SHIN, HUN-JONG
分类号 H01L21/28;H01L29/76;(IPC1-7):H01L29/76 主分类号 H01L21/28
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