发明名称 |
SEMICONDUCTOR DEVICE & METHOD FOR FORMING THE SAME |
摘要 |
The present invention is to provide a method for fabricating semiconductor device. The method for fabricating according to the present invention comprises: a) forming a gate electrode(14) on a semiconductor substrate(10) using polysilicon gate electrode(14); b) forming a spacer(16) on side walls of the gate electrode(14); c) forming an insulating layer(20) after forming a diffusion layer(15) using the gate electrode(14) as a mask; d) forming a contact hole(21,23) on the gate electrode(14) and the diffusion layer(15); and e) forming a wiring layer(24,25) on the insulating layer(20), thereby interconnecting the wiring layer(24,25) with the gate electrode(14) and the diffusion layer(15). The present invention further comprises forming a second silicide(22) between contact portions of the wiring layer(24,25) and the first silicide(20). The first silicide(20) is formed on the wiring layer(24,25) and the gate layer(14) and the diffusion layer(15).
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申请公布号 |
KR970005729(B1) |
申请公布日期 |
1997.04.19 |
申请号 |
KR19910012170 |
申请日期 |
1991.07.16 |
申请人 |
SAMSUNG ELECTRONICS CO.,LTD. |
发明人 |
SIM, MYUNG-SUB;SHIN, HUN-JONG |
分类号 |
H01L21/28;H01L29/76;(IPC1-7):H01L29/76 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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