发明名称 METHOD FOR FABRICATING CAPACITORS OF SEMICONDUCTOR DEVICE
摘要 <p>The present invention relates a process for making a capacitor of a semiconductor element. As a semiconductor element is highly integrated, more capacitance is required. Therefore, according to the present invention, a storing electrode including an increased area mask having a size control of a mask prior to storing, a selective growing technique, and an etch selective rate during wet drying are qequentially formed. A dielectric film and a plate electrode are formed on the storing electrode. The capacitor according to the present invention has an enough capacitance and achieves a high integration of a semiconductor element. The present invention relates a process for making a capacitor of a semiconductor element. As a semiconductor element is highly integrated, more capacitance is required. Therefore, according to the present invention, a storing electrode including an increased area mask having a size control of a mask prior to storing, a selective growing technique, and an etch selective rate during wet drying are qequentially formed. A dielectric film and a plate electrode are formed on the storing electrode. The capacitor according to the present invention has an enough capacitance and achieves a high integration of a semiconductor element.</p>
申请公布号 KR0126623(B1) 申请公布日期 1997.12.26
申请号 KR19940019192 申请日期 1994.08.03
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD 发明人 KIM, SUK-SOO
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):G03F7/00;H01L21/70 主分类号 H01L27/04
代理机构 代理人
主权项
地址