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发明名称
Method of measuring period of surface defect
摘要
申请公布号
EP0358236(B1)
申请公布日期
1997.12.29
申请号
EP19890116688
申请日期
1989.09.08
申请人
FUJI PHOTO FILM CO., LTD.
发明人
KISO,TAKESHI;MASUDA, TAKANORI
分类号
G01B11/30;G01N21/88;G01N21/89;G01N21/892;(IPC1-7):G01N21/89;G06F17/15
主分类号
G01B11/30
代理机构
代理人
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