| 摘要 |
<p>PROBLEM TO BE SOLVED: To obtain an infrared reflection light spectrum having low background and high analytical accuracy by employing a sample to be measured coated with a thin film of a metal having high reflectance as a reference sample. SOLUTION: A sample to be measured is coated with a thin metallic film and employed as a reference sample. The sample is coated with a metal having high reflectance, preferably higher than 0.7. Preferable metal includes gold, platinum, silver, aluminum, etc. and gold is more preferable. The film is formed as thin as possible so long as infrared absorption by an underlying sample is prevented. The thickness is set in the range of 5-100Å, preferably in the range of 10-30Å. Analysis is performed by measuring the spectrum of infrared reflection light in a wavelength range corresponding at least to measuring terms with reference to the sample coated with a thin metallic film and determining the infrared spectrum of the sample to be measured. The measuring wavelength is normally in the range of 4000-600cm<-1> .</p> |
