发明名称 ION CHROMATOGRAPHY SYSTEM FOR ENVIRONMENTAL ANALYSIS WITHIN SEMICONDUCTOR EQUIPMENT
摘要 <p>PROBLEM TO BE SOLVED: To enable quickly handling of any condition during an analysis by immediately analyzing atmospheric components at a measuring position. SOLUTION: There are arranged an air forcing type impinging device and an ion chromatography. The impinging device is provided with an absorbing liquid container 39, a suction pipe 32 and an exhaust pipe 35 by which outside is linked to the container 39 and a pump 37 for forcing atmospheric air and the ion chromatography is provided with a guard column 16, a separation column 17 and a detector 18. In this ion chromatography system, a intake port of the suction pipe 32 is positioned at a measuring target and the impinging device is linked to the ion chromatography so that an absorbing solution of the absorbing liquid container 39 directly enters a sample injection port of the ion chromatography.</p>
申请公布号 JPH10206409(A) 申请公布日期 1998.08.07
申请号 JP19970355646 申请日期 1997.12.24
申请人 SAMSUNG ELECTRON CO LTD 发明人 SHU SHINGO;KIN SHOKEI;KYO SEITETSU
分类号 G01N1/22;G01N30/04;G01N30/06;G01N30/16;G01N30/20;G01N30/46;G01N30/88;G01N30/96;H01L21/00;H01L21/48;(IPC1-7):G01N30/88 主分类号 G01N1/22
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