发明名称 |
ION CHROMATOGRAPHY SYSTEM FOR ENVIRONMENTAL ANALYSIS WITHIN SEMICONDUCTOR EQUIPMENT |
摘要 |
<p>PROBLEM TO BE SOLVED: To enable quickly handling of any condition during an analysis by immediately analyzing atmospheric components at a measuring position. SOLUTION: There are arranged an air forcing type impinging device and an ion chromatography. The impinging device is provided with an absorbing liquid container 39, a suction pipe 32 and an exhaust pipe 35 by which outside is linked to the container 39 and a pump 37 for forcing atmospheric air and the ion chromatography is provided with a guard column 16, a separation column 17 and a detector 18. In this ion chromatography system, a intake port of the suction pipe 32 is positioned at a measuring target and the impinging device is linked to the ion chromatography so that an absorbing solution of the absorbing liquid container 39 directly enters a sample injection port of the ion chromatography.</p> |
申请公布号 |
JPH10206409(A) |
申请公布日期 |
1998.08.07 |
申请号 |
JP19970355646 |
申请日期 |
1997.12.24 |
申请人 |
SAMSUNG ELECTRON CO LTD |
发明人 |
SHU SHINGO;KIN SHOKEI;KYO SEITETSU |
分类号 |
G01N1/22;G01N30/04;G01N30/06;G01N30/16;G01N30/20;G01N30/46;G01N30/88;G01N30/96;H01L21/00;H01L21/48;(IPC1-7):G01N30/88 |
主分类号 |
G01N1/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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