| 摘要 |
A two-mode surface defect testing device comprises a first source of substantially collimated light which passes along a first light path system to direct the collimated light to a holder for a surface for testing. The surface reflects the light, which is received and directed from the surface typically through at least some of the first light path system to an image processing apparatus. A second source of light is also provided, for providing substantially non-collimated light from the second source to a surface for testing in the holder, which may be the same surface for testing as above. This non-collimated light is reflected from the surface to image processing apparatus. The light may be non-polarized. By use of the two modes of testing, defects may be respectively detected at the outer surface of a transparent coating over an opaque surface, and defects in the opaque surface itself may also be detected.
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