发明名称 ELECTRON BEAM DETECTING DEVICE AND SAMPLE DETECTING METHOD USING ELECTRON BEAM
摘要 <p>PROBLEM TO BE SOLVED: To ensure that energy distribution of irradiation beams on a sample surface is substantially uniform and to reduce an energy loss in the irradiation beams from an electron gun. SOLUTION: A crossover of electron beams is formed by an electron gun 21 having a cathode face, a crossover image is formed at an aperture diaphragm (AS) disposed inside of electron beam irradiating means for introducing the electron beam to a sample 11, an image of the cathode face is formed at a visual field diaphragm disposed inside the electron beam irradiation means, the electron beams are irradiated to the sample 11, a generated electron including at least one of a secondary electron and a reflected electron generated based on the electron beams irradiated to the sample 11 is guided onto a detector 42 via an aperture diaphragm, and an image of the sample 11 formed on the detector 42 is detected.</p>
申请公布号 JPH11144666(A) 申请公布日期 1999.05.28
申请号 JP19970302336 申请日期 1997.11.05
申请人 NIKON CORP 发明人 NISHIMURA HIROSHI
分类号 G01N23/225;G21K5/04;H01J37/21;H01J37/244;H01J37/29;(IPC1-7):H01J37/29 主分类号 G01N23/225
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