发明名称 REPAIR CIRCUIT HAVING ENTY FUSE FOR SURPLUS CELL PROGRAM AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A repair circuit having anti fuse for a surplus cell capable of improving yield and reliance of a semiconductor device by using a threshold voltage of an insulator is provided. CONSTITUTION: The repair circuit having en anti fuse for a surplus cell program comprising: a half power supply(100) for performing a switching operation to supply a half supply power; a programming voltage supply section(40) for supplying a programming voltage to program a bad cell; a ground voltage supply section(30) for applying a ground voltage in response to an address signal; an anti fuse(20) charged by the half supply power from the half power supply(100) at a normal operation, and destroying and programming an insulating film according to a difference between the voltage from the programming voltage supply section(40) and the voltage from the ground voltage supply section(30); and an output section(50) for generating an output signal according to a voltage applied to from a node to which the half power supply(100), the programming voltage supply section(40), and the anti fuse(20) are common connected.
申请公布号 KR20000001493(A) 申请公布日期 2000.01.15
申请号 KR19980021787 申请日期 1998.06.11
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 KIM, MI RAN;CHANG, MYUNG SIK;KIM, JIN GUK
分类号 H01L21/82;G11C29/04;H01L21/66;H01L21/8246;(IPC1-7):H01L21/66 主分类号 H01L21/82
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