发明名称 |
REPAIR CIRCUIT HAVING ENTY FUSE FOR SURPLUS CELL PROGRAM AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A repair circuit having anti fuse for a surplus cell capable of improving yield and reliance of a semiconductor device by using a threshold voltage of an insulator is provided. CONSTITUTION: The repair circuit having en anti fuse for a surplus cell program comprising: a half power supply(100) for performing a switching operation to supply a half supply power; a programming voltage supply section(40) for supplying a programming voltage to program a bad cell; a ground voltage supply section(30) for applying a ground voltage in response to an address signal; an anti fuse(20) charged by the half supply power from the half power supply(100) at a normal operation, and destroying and programming an insulating film according to a difference between the voltage from the programming voltage supply section(40) and the voltage from the ground voltage supply section(30); and an output section(50) for generating an output signal according to a voltage applied to from a node to which the half power supply(100), the programming voltage supply section(40), and the anti fuse(20) are common connected.
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申请公布号 |
KR20000001493(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980021787 |
申请日期 |
1998.06.11 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
KIM, MI RAN;CHANG, MYUNG SIK;KIM, JIN GUK |
分类号 |
H01L21/82;G11C29/04;H01L21/66;H01L21/8246;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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