发明名称 |
DEVICE FOR TESTING THREE-STATE-OUTPUT |
摘要 |
PURPOSE: A device for testing three-state-output is provided to increase an efficiency of checking the precise data value and detecting an error and to largely decrease a testing time. CONSTITUTION: A device for testing a three-state output comprises: parallel connected two memory cell arrays(21, 23) fed with data signals(a, b) inputted through a data input pin(DQ) for storing the data signals; and an output driving instrument(25) fed with the data signals stored in the memory cell arrays for outputting an output signal of three states for judging the precision of the data after testing the sameness of the data signals.
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申请公布号 |
KR20000003615(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980024875 |
申请日期 |
1998.06.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
SHIM, YUNG BO;SHIN, JONG GYUNG |
分类号 |
G11C29/00;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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