| 摘要 |
<p>PROBLEM TO BE SOLVED: To easily form a sample of a proper thickness by placing a small material on a flat substrate made of a material where infrared rays can be transmitted or reflected and pressing the material with a pressing tool in a small area and a flat press surface for forming a material in a thin-film shape. SOLUTION: One portion of a specific site 41 of a sample base material 40 is extracted as a material 43 by a needle 42, and it is placed on an upper surface 21a of a substrate 21. A press tool is retained, and the material 43 is pressed by a press part 23 so that a sample S can be thinned to a specific thickness. For performing the microscopic spectrophotometry of the sample S, the substrate 21 where the sample S is placed is replaced by the sample- retaining member of a microscopic Fourier transform infrared spectrophotometer(FTIR), and microscopic FTLR is set to a reflection mode to carry out measurement. In a method for forming the sample S and a device for forming it, a simple sample formation tool is used, and the material 43 is pressed manually, thus easily forming the sample S any special technique and any complex device are not required and hence the sample S can be handled extremely easily.</p> |
