发明名称 POLISHING AGENT FOR CMP AND POLISHING OF SUBSTRATE
摘要 <p>PROBLEM TO BE SOLVED: To obtain a polishing agent for CMP, which can be easily disposed of when it becomes a waste, can polish the surface of a substrate such as a silicon oxide film at a high rate without scratching, and can show a ratio of the rate of polishing a silicon oxide film to that of polishing a silicon nitride film of 10 or greater, and to provide a method for polishing a substrate therewith. SOLUTION: There are provided a polishing agent for CMP, comprising cerium oxide particles, a dispersant, a biodegradable additive which has a relative detergency of 10 to below 15 when the relative detergency of sodium tripolyphosphate is taken as 10, and that of disodium 3-oxapentanedioate is taken as 0, and water; and a method for polishing a substrate, comprising pressing a substrate on which a film to be polished has been formed against the polishing cloth of a polishing surface plate and moving the substrate and the surface plate to polish the film to be polished while feeding the polishing agent for CMP into a space between the film to be polished and the polishing cloth.</p>
申请公布号 JP2000109813(A) 申请公布日期 2000.04.18
申请号 JP19980286355 申请日期 1998.10.08
申请人 HITACHI CHEM CO LTD 发明人 KOYAMA NAOYUKI;ASHIZAWA TORANOSUKE;YOSHIDA MASATO
分类号 B24B37/00;C09K3/14;H01L21/304;(IPC1-7):C09K3/14 主分类号 B24B37/00
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