发明名称 System and method for sampling and/or placing objects using low discrepancy sequences
摘要 A system and method for improved image characterization, object placement, mesh design and pattern matching utilizing Low Discrepancy sequences. The Low Discrepancy sequence is designed to produce sample points which maximally avoid one another, i.e., the distance between any two sample points is maximized. The invention may be applied specifically to methods of image characterization, pattern matching, acquiring image statistics, object location, image reconstruction, motion estimation, object placement, sensor placement, and mesh design, among others. Image characterization is performed by receiving an image and then sampling the image using a Low Discrepancy sequence, also referred to as a quasi-random sequence, to determine a plurality of sample pixels in the image which characterize the image. Sensor placement is performed by generating a Low Discrepancy sequence for the desired placement application, and then selecting locations for the optimal placement of sensors using the generated Low Discrepancy sequence. The pattern matching method may operate to locate zero or more instances of a template image in a target image. The pattern matching method may perform a local stability analysis around at least a subset of the sample pixels to determine differing stability neighborhood sizes and/or step sizes. The pattern matching method may also perform rotation invariant pattern matching by sampling the template image along one or more rotationally invariant paths, preferably circular perimeters, to produce one or more sets of sample pixels. <IMAGE>
申请公布号 EP1018708(A2) 申请公布日期 2000.07.12
申请号 EP20000100121 申请日期 2000.01.05
申请人 NATIONAL INSTRUMENTS CORPORATION 发明人 WENZEL, LOTHAR;NAIR, DINESH;VAZQUEZ, NICOLAS;DEKEY, SAMSON
分类号 G06K9/64;G06T7/00;G06T7/20 主分类号 G06K9/64
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