发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a semiconductor device is provided to be easy to connect two conductors electrically by making an insulation film between the conductors easily broken away. CONSTITUTION: A method for fabricating a semiconductor device comprises forming an oxide film(10) for an interlayer insulation and flattening the oxide film(10). The oxide film(10) is selectively removed so as to form a contact for connecting a first polysilicon film as one node of an anti-fuse to a junction. The first polysilicon film is formed on the oxide film(10) comprising the contact hole. The first polysilicon film is patterned by using an anti-fuse mask, to thereby form a first polysilicon film pattern. A P2O5 layer is formed on the first polysilicon film pattern(12), and then is etched so as to remain on the pattern(12) unevenly. The first polysilicon film pattern(12) is etched by a dry etch method by using the P2O5 layer(13a) as a mask, and a dielectric film and a second polysilicon film are sequentially formed on a resultant structure.
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申请公布号 |
KR20000045333(A) |
申请公布日期 |
2000.07.15 |
申请号 |
KR19980061891 |
申请日期 |
1998.12.30 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
KIM, EUL RAK |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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