发明名称 MAGNETRON SPUTTERING DEPOSITION DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a magnetron sputtering deposition device capable of improv ing the plane uniformity of the film thickness of the formed film so as to flex ibly correspond to the change of deposition conditions. SOLUTION: This magnetron sputtering deposition device has a susceptor 14 and a target holder 16 confronted in an airtight treating chamber 10. A semiconductor wafer W is placed on the susceptor 14. The target holder 16 is fitted with a target T contg. a deposition material. The target holder 16 is connected with a 1st RF power source 17. For forming the magnetic field with the magnetic line of force parallel to the lower face of the target T as the center, an electromagnet 18 is provided. The space between the susceptor 14 and the target holder 16 is provided with a coil antenna 21. The coil antenna 21 is connected with a 2nd RF power source 22. The 2nd RF power source can change the value of electric power independently from the 1st RF power source 17.
申请公布号 JP2000212740(A) 申请公布日期 2000.08.02
申请号 JP19990010674 申请日期 1999.01.19
申请人 TOSHIBA CORP 发明人 HIOKI TAKESHI;ONOZUKA YUTAKA;UEDA TOMOMASA;AKIYAMA MASAHIKO
分类号 C23C14/35;H01L21/285;(IPC1-7):C23C14/35 主分类号 C23C14/35
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