| 摘要 |
<p>PROBLEM TO BE SOLVED: To sufficiently reduce the data inspection time by storing an address of a memory cell judged to be failed first by program verification and using the failed memory cell whose address is stored for a start memory cell by the succeeding program verification. SOLUTION: In the case where the result of comparison between data to be stored in a data register and data read shows a failure and the address is a column address having a failure first, the address is stored in a fail address register 1 and the verification after the succeeding program is executed from this address failed. That is, an address comparator circuit 3 and a column decoder 4 or the like (a selection means) are used to select the memory cell whose address is stored in the register 1 to be a start memory cell for the succeeding verification. Thus, it is not required to conduct the program verification for all column addresses for the 2nd and succeeding program verification tests.</p> |
