发明名称 APPARATUS FOR TESTING ELECTRONIC COMPONENTS ACCOMMODATED IN A CARRIER STRIP
摘要 <p>Apparatus for testing one or more electronic components (2), particularly integrated circuits, which are accommodated in a carrier strip (1) and whose terminal pins (3) are electrically separated from one another, the apparatus at least comprising supporting means (6) for supporting the carrier strip (1), a test head (8) which has an essentially fixed position with respect to its surroundings and has one or more contacts (9) designed for electrically connecting terminal pins (3) of the one or more electronic components (2) to a tester and drive means for bringing at least terminal pins (3) of the electronic components (2) into contact with the test head (8), wherein the test head (8) comprises a printed circuit board (8), said printed circuit board (8) comprising the one or more contacts (9). An apparatus of this type has a very durable and yet simple and inexpensive test head.</p>
申请公布号 WO2000079295(A1) 申请公布日期 2000.12.28
申请号 NL2000000442 申请日期 2000.06.23
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址