发明名称 |
METHOD FOR INSPECTING LIQUID CRYSTAL DISPLAY DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To easily evaluate and judge a flicker level in an inspection before completing a liquid crystal display device at the time of inspecting the liquid crystal device provided with inspection wiring in a liquid crystal cell. SOLUTION: A 1st gate side inspection wiring G1 is connected to a gate wiring 2 for giving a gate potential to gate each switching element 4 of the odd numbered lines in the pixel array, and a 2nd gate side inspection wiring G2 is connecte to the gate wiring 2 for giving a gate potential to gate each switching element 4 of the even numbered lines, thereby displaying a flickering screen by means of the display by a driving potential to the 1st gate side inspection wiring G1 and a driving potential to source side inspection wirings S1-S3 and by means display by a driving potential to the 2nd gate side inspection wiring G2 and a driving potential to the source side inspection wiring S1-S3.</p> |
申请公布号 |
JP2001033813(A) |
申请公布日期 |
2001.02.09 |
申请号 |
JP19990202381 |
申请日期 |
1999.07.16 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
HOSHINO SHINICHI |
分类号 |
G01R31/00;G02F1/13;G02F1/136;G02F1/1365;G02F1/1368;(IPC1-7):G02F1/136 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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