发明名称 METHOD AND APPARATUS FOR X-RAY FLUORESCENT ANALYSIS
摘要 PROBLEM TO BE SOLVED: To perform an excellent analysis even for atomic species of an asymmetrical energy spectrum by conducting profile fitting at an actually measured energy spectrum by using a predetermined asymmetrical profile function. SOLUTION: The apparatus for a X-ray fluorescent analysis comprises a computer 6 for executing profile fitting using an asymmetrical profile function and a symmetrical profile function of a gauss function or a Lorentz function for introducing, for example, an asymmetrical factor to a pseudo Voigt function or a Peason VII function. A fluorescent ray table of each atomic species for constituting a sample 2 is read from a database 62, a predetermined profile function is read from a function memory 61, and an energy profile of each single atomic species is manufactured. A predetermined superposition profile is formed by using a predicted composition ratio, the fitting is repeated by changing a function parameter and the ratio until the superposition profile and the measured spectrum coincide, thereby obtaining the ratio to be obtained.
申请公布号 JP2001083109(A) 申请公布日期 2001.03.30
申请号 JP19990256367 申请日期 1999.09.09
申请人 RIGAKU CORP 发明人 OZAWA TETSUYA;OMOTE KAZUHIKO;HARADA JINPEI
分类号 G01N23/223;(IPC1-7):G01N23/223 主分类号 G01N23/223
代理机构 代理人
主权项
地址