发明名称 CURRENT SENSE AMPLIFIER OF SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A current sense amplifier of a semiconductor memory device is provided to reduce of a current consumption by limiting the amount of a current supplied to a sensing line with a simple circuit configuration. CONSTITUTION: A cell current control circuit(30) comprises a PMOS transistor(P20) and NMOS transistors(N20,N21), and a current mirror(32) comprises PMOS transistors(P21,P22,P23) and an NMOS transistor(N25). And a current mirror(34) comprises a PMOS transistor(P23) and NMOS transistors(N23,N24). A reference current control circuit(36) comprises a PMOS transistor(P25) and NMOS transistors(N26,N27). The amplifier also comprises an NMOS transistor(N22) and inverters(I3,I4). A voltage(VPP) applied to a dummy floating gate memory cell is a word line voltage level higher than a power supply voltage(VCC). The cell current control circuit changes a conductance of the PMOS transistor(P23) and the NMOS transistor(N22). The PMOS transistor induces a voltage between the current mirror(34) and a sensing line(24), and changes the conductance properly to the current intensity of the current mirror(34).
申请公布号 KR20010054445(A) 申请公布日期 2001.07.02
申请号 KR19990055258 申请日期 1999.12.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, MIN SANG
分类号 G11C7/06;(IPC1-7):G11C7/06 主分类号 G11C7/06
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