发明名称 |
METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to improve reliability and yield, by effectively eliminating polymer, and by preventing a lower electrode from being desorbed in a cleaning process. CONSTITUTION: A metallic material is used as a source material of upper and lower electrodes(34,32) in a process for forming a capacitor. A dry-etching process exposing the metallic material is performed by using a predetermined photoresist layer pattern. An RF plasma treatment is performed to eliminate polymer generated in the dry-etching process by using gas including at least F and O.
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申请公布号 |
KR20010061630(A) |
申请公布日期 |
2001.07.07 |
申请号 |
KR19990064128 |
申请日期 |
1999.12.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KWON, IL YEONG;KWON, O SEONG;YANG, U SEOK |
分类号 |
H01L27/105;(IPC1-7):H01L27/105 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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