发明名称 METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to improve reliability and yield, by effectively eliminating polymer, and by preventing a lower electrode from being desorbed in a cleaning process. CONSTITUTION: A metallic material is used as a source material of upper and lower electrodes(34,32) in a process for forming a capacitor. A dry-etching process exposing the metallic material is performed by using a predetermined photoresist layer pattern. An RF plasma treatment is performed to eliminate polymer generated in the dry-etching process by using gas including at least F and O.
申请公布号 KR20010061630(A) 申请公布日期 2001.07.07
申请号 KR19990064128 申请日期 1999.12.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KWON, IL YEONG;KWON, O SEONG;YANG, U SEOK
分类号 H01L27/105;(IPC1-7):H01L27/105 主分类号 H01L27/105
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