发明名称 CONTACT OF JIG FOR MEASURING CHARACTERISTIC OF ELECTRONIC COMPONENT
摘要 <p>PROBLEM TO BE SOLVED: To solve such a problem that the measurement error due to inductance component and capacitance component is large and an imperfect contact is apt to be generated when a chip type electronic component having many electrodes is measured, in the conventional contact. SOLUTION: This contact is constituted of a printed board 30 on which a conductor pattern 31 is formed, an elastic member 10 fixed on the printed board 30, and metal foils 22 which cover at least a part of the upper surface of the elastic member 10 and are electrically connected with the conductor pattern 31.</p>
申请公布号 JP2001208774(A) 申请公布日期 2001.08.03
申请号 JP20000016777 申请日期 2000.01.26
申请人 TOKO INC 发明人 MURATA SEISHI
分类号 G01R1/073;G01R31/26;H01R12/28;(IPC1-7):G01R1/073 主分类号 G01R1/073
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