发明名称 |
Method for cleaning and drying semiconductor substrate |
摘要 |
The present invention provides a method for cleaning and drying a semiconductor substrate in which a semiconductor substrate onto which a pattern has been formed is cleaned and dried, which comprises steps of (1) cleaning the semiconductor substrate onto which a pattern has been formed with a cleaning solution, (2) substituting the cleaning solution with a composition solution containing a resin (A) which is decomposed by either or both of an acid and heat, and (3) decomposing and removing the resin (A) by either or both of an acid and heat. There can be provided a method for cleaning and drying a semiconductor substrate in which pattern falling or collapse occurring at the time of drying the cleaning solution after cleaning the substrate can be suppressed, and the cleaning solution can be efficiently removed, without using a specific apparatus which handles a supercritical state cleaning solution. |
申请公布号 |
US9524863(B2) |
申请公布日期 |
2016.12.20 |
申请号 |
US201414572867 |
申请日期 |
2014.12.17 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
Ogihara Tsutomu;Nagata Takeshi;Hatakeyama Jun;Kori Daisuke |
分类号 |
B08B7/00;H01L21/02;B08B3/08;B81C1/00;C08G4/00;G03F7/40 |
主分类号 |
B08B7/00 |
代理机构 |
Oliff PLC |
代理人 |
Oliff PLC |
主权项 |
1. A method for cleaning and drying a semiconductor substrate in which a semiconductor substrate onto which a pattern has been formed is cleaned and dried, which comprises steps of
(1) cleaning with a cleaning solution the semiconductor substrate onto which a pattern has been formed, (2) drying the cleaned semiconductor substrate, wherein this step (2) includes stages (2-1) and (2-2):
(2-1) substituting the cleaning solution with a composition solution containing a resin (A) which is decomposed by either or both of an acid and heat, and(2-2) decomposing and removing the resin (A) by either or both of an acid and heat. |
地址 |
Tokyo JP |