发明名称 Processing apparatus for processing sample in predetermined atmosphere
摘要 This invention relates to a processing apparatus for processing a sample such as a substrate. The apparatus includes a process chamber having an exposure apparatus for transferring a pattern onto a substrate as a sample in a predetermined atmosphere, a load-lock chamber connected to the process chamber, a transfer mechanism for transferring the substrate between the load-lock chamber and a coater/developer, a clean booth which covers the transfer path of the transfer mechanism, and a transfer atmosphere forming mechanism for flowing a clean gas in the clean booth.
申请公布号 US2002002946(A1) 申请公布日期 2002.01.10
申请号 US20010897930 申请日期 2001.07.05
申请人 TANAKA YUTAKA;TERASHIMA SHIGERU;HARA SHINICHI 发明人 TANAKA YUTAKA;TERASHIMA SHIGERU;HARA SHINICHI
分类号 B65G49/00;G03F7/20;H01L21/00;H01L21/02;H01L21/027;H01L21/677;(IPC1-7):H01L21/00;G03F7/26;G21K5/00;G03B42/02;H01L21/64;C23C16/00;G03C5/00;G03F7/23;G03B27/42;H01L21/68 主分类号 B65G49/00
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