| 摘要 |
PROBLEM TO BE SOLVED: To test many EDS test items using an EDS test board for a relatively low-frequency. SOLUTION: An IC10 comprising a circuit for processing a high-frequency signal is provided with a test mode circuit 13 for shifting a frequency band to a low-frequency side. The test mode circuit 13 is functioned from a test circuit 20 at least at an EDS test. Under the condition, an EDS test device for low-frequency is used to test a prescribed item.
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