发明名称 |
AUTOMATIC PRECHARGE CONTROL CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PURPOSE: An automatic precharge control circuit of a semiconductor memory device is provided, which reduces a time required in precharging a corresponding column, after a precharge command is applied from the external. CONSTITUTION: A column active signal generation part(60) generates a column active signal(PRB) to activate a corresponding column a logic operation of a RAS signal(/RAS), a CAS signal(/CAS), a write enable signal(/WE) and a bank selection signal(BANK). A delay signal generation part(62) generates a delay signal(PRD) by delaying and inverting a low column active signal(PRB). An auto precharge signal generation part(68) generates an auto precharge signal(PAPB) using an internal precharge command signal(CA10) and an internal bank selection signal(PBANK). A column address reset signal generation part(64) generates a column address reset signal(PDRAPB) controlling a reset of an internal address decoder(70) by logic operation of the delay signal and the auto precharge signal. And a bit line sensing determination part(66) generates a control signal(PXRB) controlling the enable/disable of a bit line.
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申请公布号 |
KR20020015864(A) |
申请公布日期 |
2002.03.02 |
申请号 |
KR20000048993 |
申请日期 |
2000.08.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, CHI UK;LEE, WON SEOK |
分类号 |
G11C7/12;(IPC1-7):G11C7/12 |
主分类号 |
G11C7/12 |
代理机构 |
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主权项 |
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地址 |
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