发明名称 CERAMIC MULTILAYER WIRING BOARD AND SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To prevent a metal pad formed on the main surface of a ceramic multilayer wiring board from being mutually short-circuited via a conductive resin that has flowed out. SOLUTION: Arithmetic average roughness Ra1 on the main surface of the ceramic multilayer wiring board 4 should be 0.01 to 0.1μm, and at the same time arithmetic average roughness Ra2 on the upper surface of a metal pad 5 should be 0.1 to 0.5μm.</p>
申请公布号 JP2002093934(A) 申请公布日期 2002.03.29
申请号 JP20000279871 申请日期 2000.09.14
申请人 KYOCERA CORP 发明人 SUGIMOTO KENJI
分类号 H05K3/32;H01L21/60;H01L23/12;H05K3/46;(IPC1-7):H01L23/12 主分类号 H05K3/32
代理机构 代理人
主权项
地址