发明名称 Method and apparatus for inspecting high-precision patterns
摘要 A device and method for inspecting a test piece with a laser beam in which the laser beam is divided into plural beams, and each of the plural beams has an identification marker, such as a particular polarity or intensity. Each of the marked beams, scans a different portion of the test piece to reduce the time needed to inspect the test piece.
申请公布号 US6381356(B1) 申请公布日期 2002.04.30
申请号 US19970954263 申请日期 1997.10.20
申请人 NEC CORPORATION 发明人 MURAKAMI SHINGO;YAMANE TSUYOSHI;OGURA YUKIO;NAKATANI KATSUHIKO;AIDA YOSHIAKI
分类号 G01N21/95;H01L21/66;(IPC1-7):G06K9/00 主分类号 G01N21/95
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