发明名称 Method and apparatus for testing a temperature sensor
摘要 In accordance with one embodiment of a method and apparatus for testing a temperature sensor, an apparatus includes at least one component that affects ambient temperature. The at least one component is positioned on a circuit board so that when a current is applied to the at least one component the temperature of a temperature sensor is affected, where the temperature sensor is attached to a battery in contact with the circuit board. The response of the temperature sensor further includes the capability to be measured by external equipment. In accordance with another embodiment of a method and apparatus for testing a temperature sensor, a method of testing a temperature sensor attached to a battery, the battery being in contact with a circuit board, is as follows. The response to a temperature sensor is measured. Current is applied to the at least one heating component with sufficient proximity of the temperature sensor to affect its temperature. The response of a temperature sensor is measured after the temperature of a temperature sensor has been affected.
申请公布号 US2002126733(A1) 申请公布日期 2002.09.12
申请号 US20020150318 申请日期 2002.05.16
申请人 BLANKENAGEL JOHN A. 发明人 BLANKENAGEL JOHN A.
分类号 G01K15/00;H05K1/02;(IPC1-7):G01K15/00;G01K1/14;G01K7/16 主分类号 G01K15/00
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