发明名称 |
DEPOSITION METHOD FOR THICK DIELECTRIC FILM |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for depositing a film having a thickness of >=20μm by performing a treatment in single operation onto many wafers in the same batch successively using the continuous deposition in a commercial reactor. SOLUTION: The deposition method contains a step where plural layers in which each layer is thinner than the final thickness of the film to be deposited are deposited by PECVD(plasma enhanced chemical vapor deposition) in a reactor to deposit a dielectric film; and a step where the above reactor is subjected to cleaning between deposition for one layer and deposition for the next layer.
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申请公布号 |
JP2002285338(A) |
申请公布日期 |
2002.10.03 |
申请号 |
JP20020028394 |
申请日期 |
2002.02.05 |
申请人 |
ZARLINK SEMICONDUCTOR INC |
发明人 |
BLAIN STEPHANE;HARRISON SYLVIE |
分类号 |
H01L21/205;C23C16/44;(IPC1-7):C23C16/44 |
主分类号 |
H01L21/205 |
代理机构 |
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地址 |
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