发明名称 DEPOSITION METHOD FOR THICK DIELECTRIC FILM
摘要 PROBLEM TO BE SOLVED: To provide a method for depositing a film having a thickness of >=20μm by performing a treatment in single operation onto many wafers in the same batch successively using the continuous deposition in a commercial reactor. SOLUTION: The deposition method contains a step where plural layers in which each layer is thinner than the final thickness of the film to be deposited are deposited by PECVD(plasma enhanced chemical vapor deposition) in a reactor to deposit a dielectric film; and a step where the above reactor is subjected to cleaning between deposition for one layer and deposition for the next layer.
申请公布号 JP2002285338(A) 申请公布日期 2002.10.03
申请号 JP20020028394 申请日期 2002.02.05
申请人 ZARLINK SEMICONDUCTOR INC 发明人 BLAIN STEPHANE;HARRISON SYLVIE
分类号 H01L21/205;C23C16/44;(IPC1-7):C23C16/44 主分类号 H01L21/205
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