发明名称 |
ASHING APPARATUS AND ASHING METHOD OF PHOTORESIST LAYER USING THE SAME |
摘要 |
PURPOSE: An apparatus and a method for ashing a photoresist layer are provided to be capable of slowly heating a wafer without popping phenomenon of the photoresist layer. CONSTITUTION: A gas supply part(105) is supplied a processing and a plasma gases into a chamber(100) via an inlet(110). A vacuum exhaust part(115) is controlled a pressure in the chamber by exhausting the gases via an outlet(120). A heating plate(125) is located at lower portion of a wafer(W) to slowly heat the wafer(W) coated a photoresist layer. A lift pin(130) is formed between the wafer and the heating plate(125) for lift-up and lift-down of the wafer. An operating part(140) is controlled the lift-up speed of the lift pin.
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申请公布号 |
KR20020075574(A) |
申请公布日期 |
2002.10.05 |
申请号 |
KR20010015645 |
申请日期 |
2001.03.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIL, JE SEONG |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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