发明名称 Semiconductor device and method of manufacture thereof
摘要 A method of manufacturing a semiconductor device comprises: a first step of interposing a thermosetting anisotropic conductive material 16 between a substrate 12 and a semiconductor chip 20; a second step in which pressure and heat are applied between the semiconductor chip 20 and the substrate 12, an interconnect pattern 10 and electrodes 22 are electrically connected, and the anisotropic conductive material 16 is spreading out beyond the semiconductor chip 20 and is cured in the region of contact with the semiconductor chip 20; and a third step in which the region of the anisotropic conductive material 16 other than the region of contact with the semiconductor chip 20 is heated.
申请公布号 US6462284(B1) 申请公布日期 2002.10.08
申请号 US20000486317 申请日期 2000.02.25
申请人 SEIKO EPSON CORPORATION 发明人 HASHIMOTO NOBUAKI
分类号 H01L21/48;H01L21/56;H01L21/60;H01L23/31;H01L23/552;H05K1/11;H05K1/18;H05K3/28;H05K3/32;(IPC1-7):H05K3/30;H05K1/16 主分类号 H01L21/48
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