发明名称 Semiconductor apparatus with improved thermal and mechanical characteristic under-fill layer and manufacturing method therefor
摘要 In a semiconductor apparatus comprising a semiconductor chip, a wiring substrate having the semiconductor chip mounted thereon, an under-fill resin sheet interposed between the semiconductor chip and the wiring substrate, and a resin sealing body for sealing the semiconductor chip, the under-fill resin sheet and the wiring substrate, the under-fill resin sheet is greater than the semiconductor chip in size, and its end is exposed from at least one side face of the resin sealing body. Since an end of the under-fill resin sheet is exposed from at least one side face of the resin sealing body, then the water contained in the under-fill resin sheet escapes from an exposed end of the under-fill resin sheet to the outside of the resin sealing body, thus making it possible to improve re-flow resistance of the semiconductor apparatus.
申请公布号 US6469373(B2) 申请公布日期 2002.10.22
申请号 US20010854559 申请日期 2001.05.15
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 FUNAKURA HIROSHI;HOSOMI EIICHI
分类号 H01L23/29;H01L21/56;H01L21/60;H01L23/31;(IPC1-7):H01L23/02 主分类号 H01L23/29
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