发明名称 Inspection chip for sensor measuring instrument
摘要 A check chip of the present invention employed at a usage of a sensor measuring device is provided with a structural characterizing portion of a convex shape, concave shape or a penetration hole at a location, by which a user is considered to pick up, and the state of the structural characterizing portion is made to be different from that of a structural characterizing portion provided on a correction chip which is similar to the check chip, in a size, the number of the structural characterizing portions, or placement location. According to the check chip constructed as above, the difference from the correction chip can be easily identified even by a visually handicapped person or a weak-sighted person, according to the difference in the structural characterizing portion, from the touch, thereby preventing the person from using the check chip and the correction chip with confused.
申请公布号 US2002152793(A1) 申请公布日期 2002.10.24
申请号 US20010958886 申请日期 2001.12.12
申请人 SATO YOSHIHARU;KOIKE MASUFUMI;KAWAMATA YASUHITO;TOKUNO YOSHINOBU 发明人 SATO YOSHIHARU;KOIKE MASUFUMI;KAWAMATA YASUHITO;TOKUNO YOSHINOBU
分类号 G01D18/00;G01N27/28;G01N33/48;G01N33/483;G01N35/00;G01N37/00;(IPC1-7):G01N27/00 主分类号 G01D18/00
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