发明名称 |
FERROELECTRIC MEMORY DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: An FRAM(Ferroelectric Random Access Memory) device and a method for manufacturing the same are provided to be capable of easily connecting an upper electrode to a plate line. CONSTITUTION: A cell capacitor of an FRAM device comprises a cylindrical lower electrode(132), a ferroelectric film(134), and upper electrodes(136'139') composed of double conductive layers. The lower electrode(132) is provided with a cylindrical structure having a bottom for closing sidewalls and lower portions of the cylindrical structure. The ferroelectric film(134) is provided with a liner shape faced to inner sides of the cylindrical lower electrode(132). A gap-filling film(137) is formed between the first upper electrode(136') and the second upper electrode(139') for filling a capacitor hole. The second upper electrode(139') is electrically connected to a plate line(150).
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申请公布号 |
KR20020080908(A) |
申请公布日期 |
2002.10.26 |
申请号 |
KR20010020766 |
申请日期 |
2001.04.18 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
AHN, HYEONG GEUN;PARK, SUN O |
分类号 |
H01L27/105;H01L21/02;H01L21/8242;H01L27/108;(IPC1-7):H01L27/105 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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