发明名称 TEMPERATURE DETECTION CIRCUIT AND INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a temperature detection circuit for actualizing a temperature detection of high accuracy with a simple structure and an integrated circuit including the temperature detection circuit. SOLUTION: This temperature detection circuit detects temperature by using the temperature characteristics of its elements, and is characterized by having nodes NA and NB each supplied with a current of always the same amplitude from a power source, a diode D3 connected to between the node NA and a ground node, a plurality of diodes D1 and D2 parallel connected between the node NB and the ground node and produced by the same manufacturing process that the diode D3 undergoes, and a comparator 3 for outputting a signal corresponding to a detected temperature according to potential at the nodes NA and NB.
申请公布号 JP2002323384(A) 申请公布日期 2002.11.08
申请号 JP20010126472 申请日期 2001.04.24
申请人 SONY CORP 发明人 TAKAGI SHUNSUKE
分类号 G01K7/01;H01L21/822;H01L27/04;(IPC1-7):G01K7/01 主分类号 G01K7/01
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