发明名称 Method of fabricating mask read only memory
摘要 A method of fabricating a mask read only memory. Embedded bit line are formed in a substrate. A gate dielectric layer and a word line are formed on the substrate. The word line is perpendicular to the bit lines. The substrate under the word line and between each pair of the bit lines is referred as a memory unit. A first dielectric layer is formed to cover the substrate. A plurality of coding windows is formed in the first dielectric layer over the memory units. Ions are implanted into the memory cells exposed by the coding windows, and a second dielectric layer is formed to fill the coding windows.
申请公布号 US2002177278(A1) 申请公布日期 2002.11.28
申请号 US20010924323 申请日期 2001.08.08
申请人 HSUEH CHENG-CHEN CALVIN 发明人 HSUEH CHENG-CHEN CALVIN
分类号 H01L21/8246;H01L27/112;(IPC1-7):H01L21/823 主分类号 H01L21/8246
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