| 摘要 |
<p>PROBLEM TO BE SOLVED: To constitute a microcomputer or the like inexpensively, to suppress occurrence of a noise, and to prevent deterioration of characteristics without enlarging current supply capability of an output driver even if an operation clock of a CPU is increased. SOLUTION: In this test method for a semiconductor memory, read-data RDT read out from a ROM synchronizing with a clock CLK of the prescribed period is sampled once during double the prescribed period, sampled data is outputted to the outside as sampling data SDT.</p> |
