SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device in which it can be determined directly whether a built-in fuse element is normally cut off or not. SOLUTION: This semiconductor integrated circuit device is provided with a LT fuse group 11 for storing replacement information used for a memory array 10, a LT fuse group 13 storing confirmation information for confirming whether the LT fuse group 11 stores accurately replacement information or not, and an input/output port 14 for outputting information PI stored actually in the LT fuse group 11 and information CI stored actually in the LT fuse group 13 to an external memory tester. The LT fuse groups 11 and 13 are manufactured based on the similar conditions, and laser inputs for respective groups are set in the similar conditions.