| 摘要 |
An assemblage of reference points arranged in a distorted pattern of rows and columns over a planar surface is used to precisely establish the coordinates of a particular situs on said surface by determining the location between said situs in relation to three of said reference points. The array is particularly useful in ascertaining the reference location of a swiveling coordinate measuring arm or other such spatial measuring device. A three-dimensional reference point array can be constructed from a similarly distributed matrix of reference points arranged in orthogonally-oriented layers of rows and columns. Positioning the probe of the measuring device over three closely located reference points is sufficient to automatically load the exact coordinates of the measuring device location into an associated data processing system.
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