发明名称 Semiconductor wafer processing apparatus and method
摘要 A wafer stage 2 for holding a semiconductor wafer in a plasma treatment apparatus by setting the wafer on the wafer stage, said wafer stage 2 comprising a base material 26 equipped with refrigerant flow paths for allowing a refrigerant for temperature adjustment to flow; a stress-reducing member 28 provided on the wafer setting side of said base material 26 and having a smaller thermal expansion coefficient than does said base material; a dielectric film 30 provided on the wafer setting side of said stress-reducing member; and a deflection-preventing member 29 provided on the wafer non-setting side of said base material and having a smaller thermal expansion coefficient than does said base material. When the wafer stage is used, the temperature of the wafer as a substrate to be processed can be controlled uniformly and very accurately.
申请公布号 US6549393(B2) 申请公布日期 2003.04.15
申请号 US20010946615 申请日期 2001.09.06
申请人 HITACHI, LTD. 发明人 KANNO SEIICHIRO;KAWAHARA HIRONOBU;SUEHIRO MITSURU;KANAI SABURO;YOSHIOKA KEN
分类号 H01L21/302;H01L21/00;H01L21/26;H01L21/3065;H01L21/68;H01L21/683;H02N13/00;(IPC1-7):H02N13/00 主分类号 H01L21/302
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