发明名称 INSTRUMENT AND METHOD FOR MEASURING THREE-DIMENSIONAL SHAPE AND THREE-DIMENSIONAL SHAPE SCANNING UNIT
摘要 PROBLEM TO BE SOLVED: To provide an instrument and method by which the shape of an object having a three-dimensional shape can be measured to a more minute level by preventing the deformation or breakage of the surface of the object at the time of measuring the shape. SOLUTION: The instrument which measures the shape of the object 30 having the three-dimensional shape has a scanning probe microscope 20 which measures the surface form of the object 30, a moving mechanism 21 which moves the microscope 20 relatively to the object 30 along the three-dimensional surface form of the object 30, and a processor 22 which processes the data about the three-dimensional shape of the object 30 measured by moving the microscope 20 along the three-dimensional surface form of the object 30.
申请公布号 JP2003130780(A) 申请公布日期 2003.05.08
申请号 JP20010324456 申请日期 2001.10.23
申请人 KOYO SEIKO CO LTD;OMAE NOBUO 发明人 KOMIYA HIROSHI;AOTO KENICHIRO;OMAE NOBUO;TAGAWA MASAHITO
分类号 G01Q10/02;G01Q10/04;G01Q30/04;G01Q60/24;(IPC1-7):G01N13/10 主分类号 G01Q10/02
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