发明名称 |
INSTRUMENT AND METHOD FOR MEASURING THREE-DIMENSIONAL SHAPE AND THREE-DIMENSIONAL SHAPE SCANNING UNIT |
摘要 |
PROBLEM TO BE SOLVED: To provide an instrument and method by which the shape of an object having a three-dimensional shape can be measured to a more minute level by preventing the deformation or breakage of the surface of the object at the time of measuring the shape. SOLUTION: The instrument which measures the shape of the object 30 having the three-dimensional shape has a scanning probe microscope 20 which measures the surface form of the object 30, a moving mechanism 21 which moves the microscope 20 relatively to the object 30 along the three-dimensional surface form of the object 30, and a processor 22 which processes the data about the three-dimensional shape of the object 30 measured by moving the microscope 20 along the three-dimensional surface form of the object 30.
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申请公布号 |
JP2003130780(A) |
申请公布日期 |
2003.05.08 |
申请号 |
JP20010324456 |
申请日期 |
2001.10.23 |
申请人 |
KOYO SEIKO CO LTD;OMAE NOBUO |
发明人 |
KOMIYA HIROSHI;AOTO KENICHIRO;OMAE NOBUO;TAGAWA MASAHITO |
分类号 |
G01Q10/02;G01Q10/04;G01Q30/04;G01Q60/24;(IPC1-7):G01N13/10 |
主分类号 |
G01Q10/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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